Appareillages de mesure de la conductivité thermique des semi-conducteurs II. La méthode d'Angström
and
J. Phys. Phys. Appl., 23 S6 (1962) 95-101
You can advise a colleague about this article by filling this form below.
Your colleague will receive an e-mail containing your message and a link to the selected article.
Here is the text to be sent:
[Your name] recommends the following article: